Browsing by Author "Chen, Xiaomei"

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    Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques
    (Elsevier, 2019-03-11) Chen, Xiaomei; Shaw, Christopher; Gelman, Leonid; Grattan, Kenneth T. V.
    In this paper, recent advances in the minimum-destructive testing of the adhesion of coating-substrate systems are reviewed, focusing on key techniques such as micro- and nano-scale levels of indentation, scratching, laser-induced wave shock, as well as the blister and buckle approach. Along with adhesion failure tests, the latest and most extensive applications of the adhesion test methods in nano-, micro- and bulk-coating technology and the associated techniques to determine the minimum damage defects left on the coatings are discussed and their use reviewed.
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    Correlation and convolution filtering and image processing for pitch evaluation of 2D micro- and nano-scale gratings and lattices
    (Optical Society of America, 2017-03-14) Chen, Xiaomei; Koenders, Ludger; Parkinson, Simon
    We have mathematically explicated and experimentally demonstrated how a correlation and convolution filter can dramatically suppress the noise that coexists with the scanned topographic signals of 2D gratings and lattices with 2-dimensional (2D) perspectives. To realize pitch evaluation, the true peaks’ coordinates have been precisely acquired after detecting the local maxima from the filtered signal, followed by image processing. The combination of 2D filtering, local-maxima detecting and image processing make up the pitch detection (PD) method. It is elucidated that the pitch average, uniformity, rotation angle and orthogonal angle can be calculated using the PDmethod. This has been applied to the pitch evaluation of several 2D gratings and lattices, and the results are compared with the results of using the CG- and FT-method. The differences of pitch averages which are produced using the PD-, CG- and FT-methods are within 1.5 pixels. Moreover, the PD-method has also been applied to detect the dense peaks of Si (111) 7×7 surface and the HOPG basal plane.