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Browsing by Author "McGovern, James"

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    Data supporting "A new parafocusing paradigm for X-ray diffraction"
    (Cranfield University, 2020-12-09 10:07) Prokopiou, Danae; McGovern, James; Davies, Gareth; Godber, Simon; Rogers, Keith; Evans, Paul; Dicken, Anthony
    A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement.
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    ItemOpen Access
    A new parafocusing paradigm for X-ray diffraction
    (International Union of Crystallography, 2020-07-24) Prokopiou, Danae; McGovern, James; Davies, Gareth; Godber, Simon; Evans, Paul; Dicken, Anthony; Rogers, Keith
    A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement.

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