Browsing by Author "Moore, Andrew J."

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    Non-destructive thickness measurement of thermal barrier coatings using terahertz radiation
    (Springer, 2021-08-06) Isern, Luis; Waddie, Andrew J.; Chalk, Christine; Moore, Andrew J.; Nicholls, John R.
    A non-destructive thickness measurement technique based on terahertz (THz) reflectivity was successfully deployed to interrogate 7 wt.% yttria-stabilised zirconia thermal barrier coatings (TBCs) produced by electron-beam physical vapour deposition (EB-PVD). The THz technique was shown to produce accurate thickness maps for different samples with a resolution of 1 × 1 mm over a surface of 65 × 20 mm that were compared with direct examination of key cross-sections. All thickness measurements on different samples were calculated using a single value of refractive index. Small defects characteristic of EB-PVD, such as “carrot growths” and variations on column inclination, were evaluated and did not produce significant variations in the refractive index of the TBC. Moreover, the thickness maps correctly display thickness variations that are a consequence of the point-source nature of EB-PVD evaporation. In summary, this paper demonstrates the technique can be successfully deployed on large surfaces, and across different coatings of the same material produced under the same deposition conditions. It is shown that a single n value is required to map the thickness distribution for all samples. This combination of qualities indicates the potential of the technique for in-line control of TBC manufacture.
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    Terahertz optical thickness and birefringence measurement for thermal barrier coating defect location
    (Optical Society of America, 2020-10-06) Waddie, Andrew J.; Schemmel, Peter J.; Chalk, Christine; Isern, Luis; Nicholls, John R.; Moore, Andrew J.
    We present a normal incidence terahertz reflectivity technique to determine the optical thickness and birefringence of yttria-stabilized zirconia (YSZ) thermal barrier coatings (TBCs). Initial verification of the method was achieved by measurement of a set of fused silica calibration samples with known thicknesses and showed excellent agreement (<1% of refractive index) with the literature. The THz-measured optical thickness and its variation through the depth profile of the YSZ coating are shown to be in good agreement (<4%) with scanning electron microscope cross-sectional thickness measurements. In addition, the position of discontinuities in both the optical thickness and birefringence appear to be correlated to coating failure points observed during accelerated aging trials