Browsing by Author "Spence, Daniel"

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    Conical shell illumination incorporating a moving aperture for depth-resolved high-energy X-ray diffraction
    (Royal Society of Chemistry, 2023-01-16) Spence, Daniel; Dicken, Anthony; Downes, David; Rogers, Keith; Evans, Paul
    In many applications, the main limitation of X-ray absorption methods is that the signals measured are a function of the attenuation coefficient, which tells us almost nothing about the chemical or crystallographic nature of objects under inspection. To calculate fundamental crystallographic parameters requires the measurement of diffracted photons from a sample. Standard laboratory diffraction methods have been refined for well over a century and provide ‘gold standard’ structural models for well-prepared samples and single crystals but have little applicability for thick heterogeneous samples as demanded by many screening applications. We present a new high-energy X-ray diffraction probe, which in comparison with previous depth-resolving hollow beam techniques, requires a single beam, point detector and a simple swept aperture to resolve sample signatures at unknown locations within an inspection space. We perform Monte Carlo simulations to support experiments on both single- and multiple-material localisation and identification. The new probe is configured and tested using low-cost commercial components to provide a rapid and cost-effective solution for applications including explosives detection, process control and diagnostics.
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    Dual conical shell illumination for volumetric high-energy x-ray diffraction imaging
    (Royal Society of Chemistry, 2018-09-13) Dicken, Anthony; Spence, Daniel; Rogers, Keith; Prokopiou, Danae; Evans, Paul
    To retrieve crystallographic information from extended sample volumes requires a high-energy probe. The use of X-rays to combine imaging with materials characterisation is well-established. However, if fundamental crystallographic parameters are required, then the collection and analysis of X-rays diffracted by the inspected samples are prerequisites. We present a new X-ray diffraction imaging architecture, which in comparison with previous depth-resolving hollow beam techniques requires significantly less X-ray power or alternatively supports significantly increased scanning speeds. Our conceptual configuration employs a pair of conical shell X-ray beams derived from a single point source to illuminate extended samples. Diffracted flux measurements would then be obtained using a pair of energy resolving point detectors. This dual beam configuration is tested using a single X-ray beam set-up employing a dual scan. The use of commercial off-the-shelf low-cost components has the potential to provide rapid and cost-effective performance in areas including industrial process control, medical imaging and explosives detection.