Lonsdale, C. M.McHardy, J. D.Storm, C. V.Roy, C. R.MacLeod, S. G.McMahon, M. I.2025-01-232025-01-232024-11-13Lonsdale CM, McHardy JD, Storm CV, et al., (2024) Material strength at high pressure - Poster. DSDS24, Cranfield Defence and Security Doctoral Symposia 2024, 13-14 November 2024, STEAM Museum, Swindon, UKhttps://dspace.lib.cranfield.ac.uk/handle/1826/23436https://doi.org/10.57996/cran.ceres-2723Over the past 30 years, advancements in the focusing schemes, beam quality, and X-ray brilliance at synchrotron light sources have enabled the reduction of X-ray beam dimensions from tens of micrometers into the sub-micrometer domain. These developments have enabled spatial mapping of the stress state at multi-megabar pressures in the diamond anvil cell. This work presents angle-dispersive X-ray diffraction results collected on beamline P02.2 at the Petra-III synchrotron using a beam size (FWHM) of 0.85 x 0.85 microns on an Ir sample. Variations in the local stress state in the sample were analysed through two approaches based on X-ray diffraction peak shifting and broadening. The results of the two methods are compared and highlight the effectiveness of Bi as a pressure transmitting medium, even at multi-megabar pressures. We look to apply these techniques to future experiments into obtaining more precise investigations of phase transitions and material strength at extreme pressure.enAttribution-NonCommercial 4.0 Internationalhttp://creativecommons.org/licenses/by-nc/4.0/High PressureDiamond Anvil CellsMaterial StrengthStress StateDiffraction MappingPoster