Groves, Roger M.James, Stephen W.Tatam, Ralph P.Fu, S.Shen, Gongxin X.Cha, Soyoung S.Chiang, F. P.Mercer, Carolyn R.2012-07-232012-07-232003-12-31R.M. Groves, S. Fu, S.W. James, R.P. Tatam. Combined shearography and speckle pattern photography for single-access multi- component surface strain measurement. Proceedings of the SPIE Optical Technology and Image Processing for Fluids and Solids Diagnostics. 3-6 September 2002, Beijing, China. Volume, 5058, 351. Eds. G.X. Shen, S.S. Cha, F.P. Chiang, C.R. Mercer.0277-786Xhttp://dx.doi.org/10.1117/12.509780http://dspace.lib.cranfield.ac.uk/handle/1826/7412Full surface strain measurement requires the determination of two out-of-plane and four in-plane displacement gradient components of the surface strain tensor. Shearography is a full-field speckle interferometry technique with a sensitivity predominately to the out-of-plane displacement gradient. Speckle pattern photography has the sensitivity to the in-plane displacement, and taking the derivative yields the in-plane displacement gradient. In this paper the two techniques are combined to yield a single-access multi-component surface strain measurement using shearography to measure the out-of-plane components and speckle pattern photography to measure the in-plane components. Results are presented of a multi-component surface strain measurement.ShearographySpeckle Pattern PhotographySurface Strain MeasurementConference paper