Kissinger, ThomasGomis, B.Ding, JialuoWilliams, StewartTatam, Ralph P.2020-03-252020-03-252019-09-18Kissinger T, Gomis B, Ding J, et al., (2019) Measurements of wire + arc additive manufacturing layer heights during arc operation using coherent range-resolved interferometry (CO-RRI). In: Joint Special Interest Group meeting between euspen and ASPE Advancing Precision in Additive Manufacturing, 16-18 September 2019, Nantes, Francehttps://www.euspen.eu/knowledge-base/AM19102.pdfhttps://dspace.lib.cranfield.ac.uk/handle/1826/15324Wire + arc additive manufacture (WAAM)promises high build rates and is well-suited to the manufacture of large structures.In-process measurements of layer height are critical for WAAM process control but are difficult to achieve due to the presence of bright arc light. In this paper, a novel coherent range-resolved interferometric (CO-RRI) technique is successfully applied to the measurement of layer heights during arc operation in a first step towards gaining full in-process control of deposition layer heights.enAttribution-NonCommercial 4.0 Internationalhttp://creativecommons.org/licenses/by-nc/4.0/In-process measurementsAdditive manufacturingRange-resolved interferometry,Coherent measurementsOptical instrumentationConference paper