Terahertz optical thickness and birefringence measurement for thermal barrier coating defect location

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dc.contributor.authorWaddie, Andrew J.
dc.contributor.authorSchemmel, Peter J.
dc.contributor.authorChalk, Christine
dc.contributor.authorIsern, Luis
dc.contributor.authorNicholls, John R.
dc.contributor.authorMoore, Andrew J.
dc.date.accessioned2020-10-07T14:22:51Z
dc.date.available2020-10-07T14:22:51Z
dc.date.issued2020-10-06
dc.description.abstractWe present a normal incidence terahertz reflectivity technique to determine the optical thickness and birefringence of yttria-stabilized zirconia (YSZ) thermal barrier coatings (TBCs). Initial verification of the method was achieved by measurement of a set of fused silica calibration samples with known thicknesses and showed excellent agreement (<1% of refractive index) with the literature. The THz-measured optical thickness and its variation through the depth profile of the YSZ coating are shown to be in good agreement (<4%) with scanning electron microscope cross-sectional thickness measurements. In addition, the position of discontinuities in both the optical thickness and birefringence appear to be correlated to coating failure points observed during accelerated aging trialsen_UK
dc.identifier.citationWaddie AJ, Schemmel PJ, Chalk C, et al., (2020) Terahertz optical thickness and birefringence measurement for thermal barrier coating defect location. Optics Express, Volume 28, Issue 21, 2020, pp. 31535-31552en_UK
dc.identifier.issn1094-4087
dc.identifier.urihttps://doi.org/10.1364/OE.398532
dc.identifier.urihttps://dspace.lib.cranfield.ac.uk/handle/1826/15867
dc.language.isoenen_UK
dc.publisherOptical Society of Americaen_UK
dc.rightsAttribution 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/*
dc.subjectThermal barrier coatingen_UK
dc.subjectBifringence measurementen_UK
dc.titleTerahertz optical thickness and birefringence measurement for thermal barrier coating defect locationen_UK
dc.typeArticleen_UK

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