A new parafocusing paradigm for X-ray diffraction
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Authors
Prokopiou, Danae
McGovern, James
Davies, Gareth
Godber, Simon
Evans, Paul
Dicken, Anthony
Rogers, Keith
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0021-8898
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Prokopiou D, McGovern J, Davies G, et al., (2020) A new parafocusing paradigm for X-ray diffraction, Journal of Applied Crystallography, Volume 53, Issue 4, August 2020, pp.1073-1079
Abstract
A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement.
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Github
Keywords
focal construct geometry, powder X-ray diffraction, Bragg–Brentano geometry, conical incident beams
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Attribution 4.0 International