High energy transmission annular beam X-ray diffraction

Abstract

We demonstrate material phase retrieval by linearly translating extended polycrystalline samples along the symmetry axis of an annular beam of high-energy X-rays. A series of pseudo-monochromatic diffraction images are recorded from the dark region encompassed by the beam. We measure Bragg maxima from different annular gauge volumes in the form of bright spots in the X-ray diffraction intensity. We present the experiment data from three materials with different crystallographic structural properties i.e. near ideal, large grain size and preferred orientation. This technique shows great promise for analytical inspection tasks requiring highly penetrating radiation such as security screening, medicine and nondestructive testing.