A self-supervised point cloud completion method for digital twin smart factory scenario construction

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2025-07-03

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2079-9292

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Xu Y, Zhu H, Honarvar Shakibaei Asli, B. (2025) A self-supervised point cloud completion method for digital twin smart factory scenario construction. Electronics, Volume 14, Issue 10, May 2025, Article number 1934

Abstract

In the development of digital twin (DT) workshops, constructing accurate DT models has become a key step toward enabling intelligent manufacturing. To address challenges such as incomplete data acquisition, noise sensitivity, and the heavy reliance on manual annotations in traditional modeling methods, this paper proposes a self-supervised deep learning approach for point cloud completion. The proposed model integrates self-supervised learning strategies for inferring missing regions, a Feature Pyramid Network (FPN), and cross-attention mechanisms to extract critical geometric and structural features from incomplete point clouds, thereby reducing dependence on labeled data and improving robustness to noise and incompleteness. Building on this foundation, a point cloud-based DT workshop modeling framework is introduced, incorporating transfer learning techniques to enable domain adaptation from synthetic to real-world industrial datasets, which significantly reduces the reliance on high-quality industrial point cloud data. Experimental results demonstrate that the proposed method achieves superior completion and reconstruction performance on both public benchmarks and real-world workshop scenarios, achieving an average CD-ℓ2 score of 15.96 on the 3D-EPN dataset. Furthermore, the method produces high-fidelity models in practical applications, providing a solid foundation for the precise construction and deployment of virtual scenes in DT workshops.

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point cloud completion, digital twin, self-supervised learning, transfer learning, 40 Engineering, 4009 Electronics, Sensors and Digital Hardware, Machine Learning and Artificial Intelligence, Networking and Information Technology R&D (NITRD), 4009 Electronics, sensors and digital hardware

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